In-Circuit Automatic test equipment 3030IL ICT

Equipo 3030IL In-Circuit Tester

Minimizes test cost 

No operator

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Important features

• True parallel test: 4x performance
• Ultra-fast test speed: lowest test cost
• Ultra-fast operation
• Automated application development
• 100% failure coverage
• Economic pin architecture
• Precise contact with the motorized receiver
• Fully upgradable and customizable
• 1000+ 3030 systems installed worldwide

High volumes. High Quality

Low Cost Test 

3030IL is the fully automatic pin bed tester expressly designed to minimize the cost of test, providing unmatched throughput without the need for operator PCB loading or test. It can be quickly integrated into SMEMA production lines or used with standard automatic board loaders / unloaders. Modular and fully upgradeable, 3030IL combines a wide range of test capabilities into a single, integrated, high performance and cost-effective system.

4 test cores. True parallel test

The 3030 board testers can be equipped with up to 4 independent cores, each with independent CPU, local memory and instrumentation, capable of testing up to 4 boards in parallel. Compared to standard ICT testers, the SPEA 3030’s throughput is up to 400% higher, minimizing the cost of board testing.

Ultra-fast operation

3030IL is fully compatible with manual 3030 systems. You can migrate production from an in-line tester to a manual tester and vice versa, without changing the device or test program. You can also make the system available for other applications during debug and board repair operations, increasing system utilization.

Clamping and testing program compatible with manual tester 3030

With the Multi-Stage option, 3030IL offers different test techniques simultaneously (e.g. In-Circuit + Functional, In Circuit + Flashing, etc.), optimizing testing between the two stages and further reducing time and costs.

No Operator

3030IL does not require an operator to load/unload the plate and perform the test. The system operates fully automated, when integrated into the SMEMA production line or with standard loaders/unloaders, increasing throughput and drastically reducing the cost of testing.

Ultra-fast test speed

Compared to the standard ATE, the test speed of the 3030 is significantly better. A dedicated CPU in each core ensures that there is no delay between instrumentation and PC. High performance relays provide fast switching time. Instrument architecture minimizes instrument setup time during tests. The ability to perform different measurements simultaneously, with a single test core, further reduces test time.

Controlled contact with motorized receiver

3030IL can be equipped with one or more 4-core blinker modules, capable of programming on parallel components of different types. They allow to program specific functions, as well as to load the system software on the ICs during the test, in order to reduce the time and cost of flashing.

High-speed Parametric ICT

The 3030IL’s high-speed parametric ICT test is capable of measuring the value of each component in a very short time. Advantages: reduced programming time (test is automatically generated), reduced test time (ICT microseconds vs FCT milliseconds), reduced repair time (automatic identification of the faulty device).

Fully upgradeable and customizable

With SPEA’s 3030 PC independent architecture, the test program resides on the tester’s CPU and the test speed is determined by the system CPU. An antivirus and other applications running on the PC do not affect the test speed. In addition, you can change/upgrade the PC at any time, without having to debug the test program again.

PC-independent architecture

With SPEA 3030’s PC-independent architecture, the test program resides on the tester’s CPU and the test speed is determined by the system CPU. An antivirus and other applications running on the PC do not affect the test speed. In addition, you can change/upgrade the PC at any time, without having to debug the test program again.

Más información en – https://www.spea.com/products/3030-inline/

Contacto controlado con receptor motorizado