In-Circuit automatic test equipment 3030CE ICT

3030CE In-Circuit Tester

High performance. High coverage.

Fully compatible with 3030 Inline

Key Features:

• True parallel test 2x
• Accessory compatible with 3030 Inline
• High-speed parametric ICT
• Automated application development
• Multiple test functions

Full compatibility with 3030 Inline

3030CE is the spike bed tester designed to offer a cost-effective manual testing solution fully compatible with 3030 Inline testers. The clamping, press and test program can be quickly and easily moved from 3030CE to 3030 Inline and vice versa, without mechanical adjustments. Modular and configurable, 3030CE provides 2x throughput compared to standard test solutions, thanks to its true 2-core parallel test. 3030CE offers multiple test capabilities, ensuring 100% coverage in a single, integrated, high-performance and cost-effective system.

True parallel test

The 3030CE fixture, press plate and test program are fully compatible with the 3030IL tester, without the need for any mechanical adjustment. You can quickly move your production from manual to automatic testers and vice versa, depending on your production needs.

Migration of fixtures and testing software to 3030 Inline

The 3030CE fixture, press plate and test program are fully compatible with the 3030IL tester, without the need for any mechanical adjustment. You can quickly move your production from manual to automatic testers and vice versa, depending on your production needs.

PC-independent architecture

With SPEA 3030 PC-independent Architecture the test program resides on the tester’s CPU and the test speed is determined by the system CPU. Antivirus and other applications running on the PC do not affect the test speed. In addition, you can change/upgrade the PC at any time, without having to re-debug the test program.

Parallel multidisposition flashing

3030CE can be equipped with one or more 4-core flashing modules, capable of programming on parallel components of different types. Flashing allows programming specific functions (BIST or BOST), as well as loading the system software on the ICs during the test phase, thus reducing programming time and cost.

Accurate contact with SPEA receivers

The tester and receiver are fully integrated, both designed by SPEA to provide reliable cost-effective turnkey test equipment. The plate contact is safe and accurate: when the system is equipped with motorized receivers, it is possible to program the speed of the presser foot according to the UUT characteristics. The descent is always planar, and it is also possible to program different contact levels, making it possible to run different tests in different areas of the UUT. The direct cable-free connection between the system instrumentation and the fixture ensures signal integrity. Finally there is no need for compressed air: 3030CE is easy to move everywhere in the plant.

High-speed parametric ICT

The high-speed TIC spea 3030CE parametric test is capable of measuring every single component value in a very short time.
Advantages: reduced programming time (test is automatically generated), reduced test time (microseconds of TIC test vs. milliseconds of FCT), repair time reduction (automatic identification of faulty device).

For futher information – https://www.spea.com/products/3030-ce/