In-Circuit 3030C ICT Automatic In-Circuit Test Equipment

3030CE In-Circuit Tester

Small equipment, high test coverage
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Key features:

• True 2x parallel test
• Small footprint
• High-speed parametric ICT
• Automatic application development
• Multiple test functions: TIC, FCT, Flashing

Compact. Powerful

3030C is the spike bed tester designed to offer a cost-effective test solution in a small chassis. Modular and configurable with a full range of instrumentation and receivers, 3030C provides 2x throughput compared to standard test solutions, thanks to its 2-core true parallel test, 3030C offers multiple test capabilities, guaranteeing 100% coverage in a single, integrated, high-performance and cost-effective system.

True Parallel Test

3030C can be equipped with up to 2 independentcores, each with independent CPU, local memory and instrumentation – capable of parallel testing up to 2 boards/board panels. Compared to standard ICT testers, the 3030C’s throughput is up to 200% higher,thus minimizing the cost of board testing.

Test cost savings

With true parallel multi-core architecture the cost of test is drastically reduced. Only one system, one operator, one drive, one fixture and one PC to test 2 PCBs at the same time.

PC-independent architecture

With SPEA 3030 PC- the test program resides on the tester CPU and the test speed is determined by the system CPU. Antivirus and other applications running on the PC do not affect the test speed. Moreover, you can change/upgrade the PC at any time, without having to re-debug the test program.

Forget about returns

3030C has been designed to help electronics manufacturers increase their product quality. By performing various test techniques with its high-performance instrumentation and stimuli, 3030C can reliably find faults undetectable by standard ICT testers.

Multi-array parallel flashing

3030C can be equipped with one or more 4-core flasher modules,capable of programming in parallel components of different types. Flashing allows programming specific functions (BIST or BOST) as well as loading the system software on the ICs during the test phase, thus reducing programming time and cost.

Precise contact with SPEA receivers

The tester and receiver are fully integrated,both designed by SPEA to provide reliable cost-effective turnkey test equipment. The plate contact is safe and accurate: when equipped with motorized receivers it is possible to program the speed of the presser foot according to the UUT characteristics. The descent is always planar, andit is also possible to program different contact levels, to run different tests in different areas of the UUT. The direct cable-free connection between the system instrumentation and the fixture ensures signal integrity. Finally, there is no need for compressed air:3030C is easy to move everywhere in the plant.

High-speed parametric TIC

The high-speed parametric TIC spea 3030C is capable of measuring every value of a single component in a very short time.Advantages: reduced programming time (the test is generated automatically), reduced TEST time (microseconds). TEST time reduction (microseconds of TIC TEST vs. milliseconds of FCT), repair time reduction (automatic identification of the faulty device).

for more information: https://www.spea.com/products/3030c/