In-Circuit automatic test equipment 3030M ICT

3030M In-Circuit Tester

Total test coverage

High performance. High scalability.

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Main features

• -75% test cost with true parallel test
• Multifunction: complete test coverage
• Fully customizable and upgradeable
• Can be equipped with power instrumentation
• Automatic generation of test programs
• Parallel programming of ICs of different types

Multifunctional testing capabilities: 100% coverage with one single system

3030M is the fully upgradable and customizable multifunction ICT tester, expressly designed to combine full test coverage and the lowest cost of test in a single handheld test set. Modular and configurable with a wide range of instrumentation and receivers, 3030M provides 4x performance compared to standard testers.

SAVE MONEY – Why buy multiple testers when you only need one? By using the 3030M, you run multiple testing techniques within a single system. Compared to multiple test stations, the benefits are enormous: no operator, a single test program, reduced industrial footprint, faster training and lower operating costs..

SAVE TIME – Testing time is considerably reduced at 3030M. First of all, costly and unnecessary handling operations are avoided. With a single board load/unload, the tester runs different tests in an optimized way, in order to avoid redundancy and over-testing of your product, saving you precious time. What about programming multiple devices? With 3030M and Leonardo OS you only need a few minutes to generate your multifunction test program.

SAVE FIELD RETURNS – 3030M has been designed to help electronics manufacturers increase their product quality. By performing several test techniques with the same tester used for ICT, all risks related to subsequent handling operations are avoided. At the end of the test, the product is ready to be delivered to the final customer.

4 Test cores, the true parallel test  

3030M se puede equipar con hasta 4 núcleos independientes , cada uno con CPU independiente, memoria local e instrumentación – capaz de probar en paralelo hasta 4 placas / paneles de placas. Esto proporciona hasta el 75% de la reducción de costos de prueba, en comparación con los evaluadores estándar de TIC. Sólo un sistema, un operador, un manejo, un accesorio y un PC para probar 4 PCBAs simultáneamente.

Parallel multidisposition flashing

3030M can be equipped with one or more 4-core flashing modules, capable of programming on parallel components of different types. Flashing allows programming specific functions (BIST or BOST), as well as loading the system software on the ICs during the test phase, thus reducing programming time and cost.

PC-independent architecture

With SPEA 3030 PC-independent Architecture the test program resides on the tester’s CPU and the test speed is determined by the system CPU. Antivirus and other applications running on the PC do not affect the test speed. In addition, you can change/upgrade the PC at any time, without having to re-debug the test program.

Fully upgradable and customizable

3030M can be factory-equipped or upgraded on field with all kind of instrumentation useful to satisfy the test requirements. It is possible to integrate power instrumentation (as programmable AC/DC generators, Active Loads, Power Matrix, programmable Power Supplies etc.) as well as third party instruments to increase test capabilities and productivity. Finally, 3030M can accommodate a wide range of fixture receiver models, also from third parties (Genrad, Ingun, Zentel, Augat Pylon…).

Accurate contact with SPEA receivers

El testeador y el receptor están totalmente integrados,ambos diseñados por SPEA para proporcionar un equipo de test llave en mano rentable confiable. El contacto de la placa es seguro y preciso: cuando el sistema está equipado con receptores motorizados, es posible programar la velocidad del presser de acuerdo con las características UUT. El descenso es siempre planar, y también es posible programar diferentes niveles de contacto para ejecutar diferentes pruebas en diferentes áreas de la UUT. La conexión directa sin cable entre la instrumentación del sistema y el accesorio garantiza la integridad de la señal. Por último, no hay necesidad de aire comprimido:3030M es fácil de mover a todas partes en la planta.

Forget about returns

3030M has been designed to help electronics manufacturers increase their product quality. By performing various test techniques with its high-performance instrumentation and stimuli, 3030M can reliably find faults undetectable by standard ICT testers.

Further info at – https://www.spea.com/products/3030-m/